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To support our testing services, our facility provides the following:
Test Platforms :
- Agilent
– 93000 (digital & mixed signal)
- Teradyne
– Catalyst, Catalyst (RF), J750, Integra Flex
- Credence
– Duo, DuoSX, Quartet, LT Vista Vision,
NP Sapphire, ASL 3000RF
- Nextest
– Maverick
Handlers :
- Seiko Epson - NS6040/6000, HM3000/HM3500
- Synax 1211
- Hyac 824/2655
- Multi-test 8704r
- ASECO
- JLSI 8653D
- MCT 4600/4610
- MT8704 IHF
Prober :
Our Burn-In service is Military & Commercial Burn-In - DSCC Certified,
and is supported with:
- 7056DC Dynamic Systems
- 26/52/92 Signal & Multi-zone Programmable
- Board test stations providing engineering support
- Computer controlled real time scan, monitoring and logging control
- Voltage and Current read-back features per slot
- 12K/CV Compatible With N2
- Graphical Pattern Editor ( PATED ) for complex burn-in
- PATED Generated Stimulus Patterns for Digital & Analog Circuits,
including Memories
- Test vectors that can be downloaded in ASCII format to any tester
& converted to run on ADEC Burn-In Chambers
The capabilities achieved and standards adhered to for our environmental
tests are as follows:
- The pattern editor capability includes –
- 128K deep vector deep standard expandable to 1MB deep
- Patterns downloadable through PC to the On-Board SRAM's.
- Repeat count, RZ/NRZ, Tristate, Looping, and Initialization.
- HAST - JEDEC Specification A110 test capability.
DESPATCH HAST, Express TEST and 4 Hirayama Style Board Compatible,
and 10 Slots per/cycle
- Temperature Cycle - JEDEC Specification A104-A
Test Capability.
- 85/85 - Computer controlled Static & Dynamic THB capabilities.
Real-Time Lot/Slot scanning & tracking. 26 - 52 channel zone
configuration systems. On-Board fault monitoring and data logging.
Blue-M 85/85 Static/Dynamic test system. Tenny Y20RC 85/85 Static/Dynamic.
- LTOL - -65 C to -100 C with dry N2 purge. 12K - AEHR,
CV - Reliability, AMT, KES systems compatibility. Tenny T14 LTOL
Dynamic chamber.
- IR Reflow - Preconditioning of plastic mount Devices, utilizing
JEDEC Specification A113-B test capability, or
according to customer specifications.
- Autoclave - Accelerated Moisture Resistant Test utilizing an
Unbiased Autoclave Pressure Pot Test. JEDEC Specification
A102-B Test Capability.
- Solderability - JEDEC Specification B102-C Test
Capability.
- Liquid-to-Liquid Thermal Shock - JEDEC
Specification A106-A Test Capability.
For additional information or a complete list of our capabilities
list, please contact us. |
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IS Test Lab delivering testing and engineering
solutions for semiconductor industry |
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