 Test Program Development:
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Turnkey (Program, loadboard, debug) |
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Platform Conversion |
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Time Reduction |
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NEXTTEST Maverick |
Handlers:
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Seiko Epson - NS6040/6000, HM3000/HM3500 |
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Synax 1211 |
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Hyac 824/2655/2000 |
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Multi-test 8704r |
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ASECO |
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JLSI 8653D |
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MCT 4600/4610 |
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MT8704 IHF |
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RASCO |
Prober:
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TSK UF 200 8" Wafer Prober |
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SEMICS Opius 12" Wafer Prober |
Temperature Forcing Units:
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Thermonics 2420 |
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Temptronics |
Production & Reliability Burn-In:
Our Burn-In service is Military & Commercial Burn-In - DSCC
Certified, and is supported with:
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7056DC Dynamic Systems |
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26/52/92 Signal & Multi-zone Programmable |
Board test stations providing engineering support
Computer controlled real time scan, monitoring and logging control
Voltage and Current read-back features per slot
12K/CV Compatible With N2
Graphical Pattern Editor ( PATED ) for complex burn-in
PATED Generated Stimulus Patterns for Digital & Analog Circuits,
including Memories
Test vectors that can be downloaded in ASCII format to any tester &
converted to run on ADEC Burn-In Chambers.
Environmental Tests:
The capabilities achieved and standards adhered to for our
environmental tests are as follows:
The pattern editor capability includes -
128K deep vector deep standard expandable to 8MB deep
Patterns downloadable through PC to the On-Board SRAM's.
Repeat count, RZ/NRZ, Tristate, Looping, and Initialization.
HAST - JEDEC Specification A110 test capability. ESPEC HAST Chamber.
Temperature Cycle - JEDEC Specification A104-A Test Capability. 85/85 - Computer controlled Static & Dynamic THB capabilities. Real-Time Lot/Slot scanning & tracking. 26 - 52 channel zone configuration
systems. On-Board fault monitoring and data logging. Blue-M 85/85 Static/Dynamic test system. Tenny Y20RC 85/85 Static/Dynamic.
LTOL - -65 C to -100 C with dry N2 purge. 12K - AEHR, CV -
Reliability, AMT, KES systems compatibility. Tenny T14 LTOL Dynamic chamber.
IR Reflow - Preconditioning of plastic mount Devices, utilizing
JEDEC Specification A113-B test capability, or according to customer
specifications.
Autoclave - Accelerated Moisture Resistant Test utilizing an
Unbiased Autoclave Pressure Pot Test. JEDEC Specification A102-B Test capability.
Solderability - JEDEC Specification B102-C Test Capability.
Liquid-to-Liquid Thermal Shock - JEDEC Specification A106-A Test
Capability.
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